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Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.

A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.

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潘涛

帕克原子力显微镜高级工程师

报告人潘涛是资深AFM应用工程师,在AFM领域工作6年,具有丰富的AFM的样品测试经验。长期从事测量力学性能的纳米尺度表征,加入帕克(Park)公司后,主要从事原子力显微镜在计量领域的相关应用。