Magnetic force microscopy (MFM) is an atomic force microscopy (AFM) application that is widely used to characterize magnetic properties of various materials at the nanoscale. In this technique, a sharp tip coated with ferromagnetic material scans the surface and maps the distribution and strength of magnetic domains on the sample. MFM mode can be applied to probe the properties of magnetic materials for academic and applied research, e.g. to characterize, evaluate, and develop magnetic storage devices and magnetic recording components such as hard disk media, and magneto-resistive heads as well as to image naturally occurring or deliberately written domain structures in magnetic materials.