AFM Certification Course
What is Atomic Force Microscopy?
We will engage in a roughly one-hour lecture exploring the finer details of how an AFM operates, the components involved in its feedback mechanism, and the atomic interaction between tip and sample. Discussion and questions are welcomed.
Interactive Demo Session One:
Lecture topics will be reinforced through demonstration and practice of Contact based imaging on a Park Systems NX series AFM. AFM operator controls are highlighted with emphasis on linking the feedback loop to changed hardware parameters.
Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.
A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.
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Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park's research user base. He received his Master's in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.