AFM Webinar Series | 2026
As the demand for higher-performance batteries continues to grow, understanding the nanoscale properties of battery materials has become increasingly important for improving energy density, cycle life, safety, and overall device performance. Many of the physical and electrochemical phenomena that influence battery behavior originate at surfaces and interfaces, highlighting the need for high-resolution characterization throughout battery research and development.
This webinar will introduce how Atomic Force Microscopy (AFM) can be applied to battery material characterization beyond conventional surface topography measurements. A range of advanced AFM techniques will be presented to provide complementary information on the structural, mechanical, electrical, and electrochemical properties of battery components.
The session will cover approaches for investigating surface morphology, local mechanical properties, electrical conductivity, resistance, surface potential, and changes associated with electrochemical reactions. Techniques such as conductive AFM, Scanning Spreading Resistance Microscopy (SSRM), Kelvin Probe Force Microscopy (KPFM), PinPoint electrical modes, and electrochemical AFM will be introduced through practical examples.
Attendees will learn how different AFM techniques can be selected and combined to characterize battery-related samples, such as cathode and anode materials. The webinar will demonstrate how multimodal AFM analysis can provide a broader understanding of material heterogeneity, local property variations, conductive pathways, electrode degradation, and interfacial characteristics at the nanoscale.
Asher Cho is a member of the Application Technology Team in the Research Equipment Division at Park Systems. He studied physics and later pursued advanced studies in the field of secondary batteries. In his current role, he supports AFM-based measurements, application development, and technical consultation across a range of research fields. His work primarily focuses on the characterization of mechanical properties using atomic force microscopy, including measurement optimization, data analysis, and the development of suitable approaches for different sample types. He also contributes to improving measurement reliability and expanding practical AFM applications.