AFM Webinar Seriesㅣ2026
Infrared Atomic Force Microscopy (IR-AFM) integrates nanoscale topographical imaging with infrared-based chemical analysis, providing powerful insight into material properties at high spatial resolution.
This webinar offers a structured introduction to IR-AFM, beginning with the fundamental working principles behind the technique. Participants will gain a clear understanding of how infrared excitation is coupled with AFM detection to generate localized chemical information at the nanoscale.
The session will also introduce key measurement modes and discuss practical aspects of data acquisition and interpretation. Attendees will learn how different operating modes influence signal generation, spatial resolution, and data quality, as well as how to approach basic spectral and mapping analysis.
Designed for researchers and engineers who are new to IR-AFM or seeking a clearer conceptual foundation, this webinar provides essential knowledge to better understand measurement results and confidently apply IR-AFM in research and analytical workflows.
Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.
A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.
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Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.
A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.
Image caption
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Luna Kim is a member of the Application Technology Team in the Research Equipment Division at Park Systems. In this role, she supports advanced application development and technical solutions for atomic force microscopy (AFM) systems across a range of research fields.
She works closely with researchers and industry partners to optimize measurement methodologies and enhance data reliability for complex materials and device characterization. With expertise in AFM operation and analysis, she contributes to delivering practical insights that bridge research needs and instrument capabilities.