AFM Workshop: Microscopy Beyond Limits
Exploring Nanoscale Features with Atomic Force Microscopy
Yuchengco Building | De La Salle University, Manila
Dive deep into the nanoscale world!
We're excited to announce our upcoming workshop on Atomic Force Microscopy (AFM) organized by Park Systems and Katrin Field Inc in collaboration with De La Salle University Manila. Learn how AFM unlock secrets of materials at the atomic level, with hands-on sessions and expert insights. Perfect for researchers, engineers, and students looking to expand their analytical toolkit.
Other than AFM, we will also delve into other crucial techniques for understanding surface properties and structures, such as Digital Holographic Microscopy (DHM), and Imaging Spectroscopic Ellipsometry (ISE). Get a holistic view of advanced characterization methods and elevate your research.
Mark your calendars!
Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.
A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.
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Dr. Stefan Kaemmer
President, Park Systems Inc.
With over 30 years immersed in the world of atomic force microscopy (AFM) and nanoscale science, Stefan is passionate about pushing the boundaries of how we image and manipulate materials at the smallest scales. Currently, he serves as President of Park Systems Inc., providing strategic input on the development of innovative AFM technologies that empower researchers worldwide. When Stefan is not diving into graphene edges or molecular twists, he enjoy exploring the fascinating underwater critters of Anilao and the mysterious caves of Mexico through scuba diving, as well as hitting the open road on his motorcycle.