Workshop en AFM | México, UANL

Fecha: 3-4 de Mayo, 2023
Hora: 09:00 - 14:00
Lugar: Showroom, Laboratorio Nacional de Clima Espacial,
Facultad de Físico Matemáticas de la UANL
Av. Alfonso Reyes #4000 Nte. Col. Regina, Monterrey, Nuevo León.
Sesiones teóricas y prácticas sobre Microscopía de Fuerza Atómica la medida eléctrica AFM más avanzada. Los temas incluyen SICM, SECCM, modos nanomecánicos y aplicaciones biológicas. ¡Únase a este taller para una demostración en vivo usando el Park NX10, El AFM de más fácil uso y preciso.
Analizaremos tus muestras en vivo, contacto: [email protected]
PROGRAMA
(DEL 3 AL 4 DE MAYO)
9:00 AM Bienvenida.
9:05 AM Presentación UANL
9:10 AM Presentación Instruments Nanotech
Ing. Centetl Alvarado, Gerente General Instruments Nanotech
9:25 AM Microscopia de Fuerza Atómica: SICM, SECCM, modos nanomecánicos y aplicaciones biológicas.
Dra. Gabriela Mendoza, General Manager LATAM, Park Systems
10:30 AM Q&A
10:45 Receso
11:00 Sesiones Practicas GRUPO 1
12:00 Sesiones Practicas GRUPO 2
12:00 Sesiones Practicas GRUPO 3
12:00 Sesiones Practicas GRUPO 4

Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.

A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.

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James received his PhD in Physics from the University of Nottingham in 2018, studying the morphology and optical properties of monolayers of self-assembled molecules and their heterostructures. He then went on to work as a postdoctoral researcher, also at the University of Nottingham, working on the formation of hybrid heterostructures of molecular assemblies and layered materials demonstrating both electroluminescence and selective triplet excitation. In 2020, James took up a position as a postdoctoral researcher at the Cambridge Graphene Centre, using scanning probe microscopy and optical spectroscopy to study electrostatics and optical properties of layered materials heterostructures with controlled twist angle and their scalable incorporation into integrated photonic circuits. Since January 2022, James has been a member of the Park Systems team as an applications scientist, supporting customers with interest ranging from fundamental physics to industrial scale production in the application of a diverse range of scanning probe microscopy techniques to gain insightful results.