Webinar Series | December 2022
From functional polymer composites to wearable electronics or 2D materials or biological structures, local variations in mechanical properties dictate the macroscopic properties. Here, atomic force microscopy offers more analytic insights beyond mere topography. In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows us to study mechanical properties like Young’s modulus, adhesion, or mechanical energy dissipation on a local scale. We will showcase how PinPoint mode enables facile integration of other modes such as conductive atomic force microscopy or piezo force microscopy and thus offers a holistic approach to nanoscale characterization. Finally, we will study the sweet side of science and demonstrate how to conduct real measurements on soft samples like chocolate and less-tasty polymer blends.
Fig. 1. A schematic of parallel stacked 2L-MoS2 on HOPG (a) is shown
Fig. 1. B: CAFM current map acquired over the bilayer region of the sample
Fig. 1. C: Performing individual current voltage measurements over domains of high and low contrast (c) reveals dramatically different characteristics between domains of each type (inset c).
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Alexander received his diploma in Chemistry from the Johannes Gutenberg University Mainz and doctorate from Max-Plank-Institute for Polymer Science, where he fabricated and characterized perovskite solar cells. His expertise spans the nanoscale functioning of thin films and interface optimization of semiconducting metal oxides using AFM-based methods like C-AFM and KPFM as a main analytical tool. Prior to joining Park Systems, he was a postdoctoral research fellow of the same institute. At Park Systems, he acts as Principle Scientist to support research and industrial collaborations.