Effective Use of AFM by Researchers Webinar Series
AFM Probe Selection:
A Quick Guide
Park Systems India
April 25, 2023 | 11:30AM (IST)
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The tip of an atomic force microscope (AFM) is at the heart of the instrument as it interacts with the sample surface and hence proper probe selection is critical for obtaining high-quality surface images. The actual shape of the tip used in AFM is an important consideration, and choice of tip shape is closely linked to mapping the properties of the sample studied.
An AFM probe is made up of a silicon chip, a cantilever, and a tip at the end of the cantilever. AFM probes are available in a variety of materials, shapes (geometry), stiffnesses (spring constants), resonance frequencies, and Q-factors. Generally, we can use non-contact or contact mode cantilever depending on its properties. The sample material and applications dictate the probe selection.
This webinar will give a glimpse of the AFM tips world and will guide you to select appropriate tips for your specific applications on AFM.
Attend the webinar and get the AFM Probe Selection Guidebook!
*To get this material, attendance of this webinar is required.
Sneak-peak of AFM Probe Selection Guidebook
Topography
Semiconductor device
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr
(k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V
Image caption
Image caption
Dr. Ashutosh Valavade
Application Scientist, Park Systems India
Dr. Ashutosh Valavade is an Application Scientist for Park Systems India and has a high level of experience in handling materials science & biological Atomic Force Microscopes (AFM). He has completed his doctorate from University of Mumbai.
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