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Ferroelectricity is observed in hexagonal boron nitride(hBN) through control of the registry of stacked layers, which we explore through both amplitude-modulated and sideband Kelvin probe force microscopy (KPFM) on the Park FX40 automatic AFM.

A schematic of the formation of parallel stacked bilayer hBN is shown in addition to a contact potential difference map measured using sideband KPFM.

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Dr. Jake Kim

Senior Application Scientist at Park Systems Headquarters

Dr. Jake brings a wealth of expertise and experience in materials science and engineering, culminating in a Ph.D. from Nanyang Technological University, Singapore. Currently serving as the Manager at Parksystems' Application Technology Center since December 2017, Dr. Jake has led initiatives to enhance nano-mechanical measurement performance for Atomic Force Microscopy (AFM) and establish reliable environments for electrochemical measurement using scanning probe microscopy (SPM). Prior to this, Dr. Jake honed his skills at Nanyang Technological University's Division of Materials Technology, focusing on platform and micro-fluidic chamber designs for AFM and investigating bio-recognition processes using force spectroscopy and AFM with molecular-functionalized tips.