Effective Use of AFM by Researchers Webinar Series
Simplicity of Operating an AFM
Park Systems India
February 27, 2023 | 11:30AM (IST)
Select Timezone
The atomic force microscope (AFM) is one of the necessary tool for mapping the nanoscale properties of a material, and hence its operation should be simple. However, one of the reasons why AFMs require an experienced user is that most conventional AFMs require complicated operation to acquire images, and conventional AFM software is difficult to set up and operate. Such AFM operations necessitate a significant amount of human resources and time.
Park Systems developed the AFM systems and SmartScan™ software to address this issue and make AFM systems more user friendly. The Park AFM system is easy to use and even an novice user can generate high-quality AFM images with a few mouse clicks using SmartScanTM software.
In this webinar, we will introduce you to the SmartScan™ AFM operating software and overall user interface.
Park Systems developed the AFM systems and SmartScan™ software to address this issue and make AFM systems more user friendly. The Park AFM system is easy to use and even an novice user can generate high-quality AFM images with a few mouse clicks using SmartScanTM software.
In this webinar, we will introduce you to the SmartScan™ AFM operating software and overall user interface.
Topography
Atomic steps on STO(110)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: PPP-NCHR
(k=42N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.62Hz
- Pixel: 512×512
Simplicity of operating an AFM
Topography
Semiconductor device
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr
(k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V
Image caption
Image caption
Dr. Ashutosh Valavade
Application Scientist, Park Systems India
Dr. Ashutosh Valavade is an Application Scientist for Park Systems India and has a high level of experience in handling materials science & biological Atomic Force Microscopes (AFM). He has completed his doctorate from University of Mumbai.
On-demand Webinar Registration Form
Please fill out the form below to watch the on-demand webinar video.
(*It might take few seconds to load the registration form. If it does not appear after refreshing, please let us know: [email protected])